Optics and Photonics Journal, 2012, 2, 300-313
http://dx.doi.org/10.4236/opj.2012.24037 Published Online December 2012 (http://www.SciRP.org/journal/opj)
Fully On-Chip Integrated Photodetector Front-End
Dedicated to Real-Time Portable Optical Brain Imaging
Ehsan Kamrani, Frederic Lesage, Mohamad Sawan
Electrical Engineering Department, Ecole Polytechnique, Montreal, Canada
Email: ehsan.kamrani@polymtl.ca
Received August 10, 2012; revised September 13, 2012; accepted September 28, 2012
ABSTRACT
Optical brain imaging using functional near infra-red spectroscopy (fNIRS) offers a portable and noninvasive tool for
monitoring of blood oxygenation. In this paper we have introduced a new miniaturized photodetector front-end on a
chip to be applied in a portable fNIRS system. It includes silicon avalanche photodiodes (SiAPD), Transimpedance am-
plifier (TIA) front-end and Quench-Reset circuitry to operate in both linear and Geiger modes. So it can be applied for
both continuous-wave fNIRS (CW-fNIRS) and also single-photon counting. Proposed SiAPD exhibits high-avalanche
gain (>100), low-breakdown voltage (<12 V) and high photon detection efficiency accompanying with low dark count
rates. The proposed TIA front-end offer a low power consumption (<1 mW), high-transimpedance gain (up to 250
MV/A), tunable bandwidth (1 kHz - 1 GHz) and very low input and output noise (~few fA/Hz and few µV/Hz). The
Geiger-mode photon counting front-end also exhibits a controllable hold-off and rest time with an ultra fast quench-
reset time (few ns). This integrated system has been implemented using submicron (0.35 µm) standard CMOS technol-
ogy.
Keywords: Biochip; Analog CMOS Integrated Circuit; Trans-Impedance Amplifier; fNIRS; Brain Imaging; Medical
Imaging; Optical Sensors
1. Introduction
Optical sensors and systems are widely applied in bio-
logical and biomedical imaging. Optical coherent tomo-
graphy (OCT), pulse-oximetry, Brillouin scattering (BLS)
imaging, Optical dermatology, and spectroscopy are
some examples. Common brain monitoring systems are
bulky, non-portable and invasive and require sophisti-
cated and expensive hardware and software tools [1], so
they are not a proper platform to be developed as a port-
able brain imaging system. The commonly used non-
invasive brain imaging techniques are electro-encepha-
lography (EEG), magneto-encephalography (MEG), po-
sitron emission tomography (PET), functional magnetic
resonance imaging (fMRI), and functional near-infrared
spectroscopy (fNIRS) [2]. Only EEG and fNIRS can be
realized using equipment that is small and light enough
to be worn continuously while allowing body move-
ments. However some portable EEG systems has been de-
veloped currently for brain imaging [3], EEG is not ideal
for human-computer interface (HCI) [4], it is susceptible
to artifacts from eye and facial movement, as well as near
by electronic devices, it requires gel in the participant’s
hair, it takes time to setup properly and is not spatially
determined [5]. We are applying fNIRS to develop
a portable tool for real-time brain imaging. fNIRS is a
non-invasive, minimally intrusive, safe, and high-tem-
poral resolution imaging technique for real-time and long-
term monitoring of the brain function and biological tis-
sues. It is considered as one of the most efficient diagno-
sis and investigation techniques of different neurological
diseases, such as, stroke and epilepsy seizures that re-
quire continuous monitoring of the patient at the hospital,
which is a costly endeavor. In contrast to the other bulky
and high-voltage brain imaging systems suffering from
electromagnetic interfaces and slight movement artifacts,
fNIRS is portable, low-voltage and immune to electro-
magnetic interferences with the advantages of ease of use
and short setup time [5]. In fNIRS, the brain tissue is
penetrated by near-infrared (NIR) radiation and the re-
flected signal is observed to investigate the brain func-
tion. In NIR range (650 nm - 950 nm), water has rela-
tively low absorption while oxy- and deoxy-hemoglobin
have high absorption.
Due to these properties, NIR light can penetrate bio-
logical tissues in the range of 0.5 - 3 cm allowing inves-
tigation of relatively deep brain tissues, and ability to
differentiate between healthy and diseased tissues based
on their optical properties. The typical CW-fNIRS sys-
tem consists of NIR light source, photodetector, data
C
opyright © 2012 SciRes. OPJ
E. KAMRANI ET AL. 301
Emitter
IR
Transmitter
Computer
Demodulator/
Amplifier
IR
Receiver
Driver/
Modulator
Photoreceiver Data
Acquisition Processing/
Storage
(a)
(b)
Figure 1. Block diagram of a typical portable wireless fNIRS (a) and the phototransceiver front-end building blocks (b).
acquisition module and control unit, and a processing
block (Figure 1(a)). The light source is placed on the
surface of the head (scalp) and it generates light in the
NIR range. Generally, the light sources used for NIRS
system are either LEDs or laser diodes that emit NIR
light with optical power within a range of 5 mW to 17
mW at discrete wavelengths (for example 735, 840, and
940 nm). The fNIRS photodetector front-end includes a
photodetector that monitors the intensity of the reflected
NIR signal, Quench-Reset Circuit, Trans-impedance Am-
plifier (TIA), Limiting Amplifier, post amplifiers and
filters (Figure 1(b)). Although fNIRS is compact when
compared to other brain imaging systems, but current
commercially available NIRS devices are still too bulky
to be wearable or portable for monitoring brain function.
They are not miniaturized enough in order to be inte-
grated with other wireless and portable medical imaging
systems intended for bedside real-time brain monitoring.
It also suffers from low spatial resolution, high-level
noise, susceptible to the internal and ambient light/tem-
perature and bias voltage variations.
In this paper we propose a miniaturized, reconfigu-
rable, low-power, low-noise and high-gain fNIRS photo-
receiver for real-time brain imaging. Integrating the pho-
todiode and corresponding circuitries on the same chip
and on-chip multi-mode operation using smart CMOS
image sensor concept has not been considered yet in lit-
erature for fNIRS application. Using smart CMOS im-
age sensor concept for fabrication of photodiode and
photodetection circuitry and integrating them on the
same chip with ability to work on different modes of
operations, leads to a more compact and miniaturized
design. Using p+/n-well topology with guard-ring and
negative feedback avalanche concept in fabrication of
photodiode, we have designed a photodiode with high
detection efficiency and low-noise using standard CMOS
process. An integrated low-noise, high-gain and low-
power photodetector TIA front-end and an ultra-fast
quench-reset front-end also have been introduced in this
paper.
The remaining parts of this paper are organized as fol-
lows. First the implementation of the CMOS photodetec-
tor is described at Section 2. The integrated electronics
front-ends for linear and Geiger modes of operation are
introduced in Sections 3 and 4 respectively. Section 5
depicts the general characteristics of the integrated sys-
tem.
2. Design of CMOS SiAPDs as Image Sensor
Conventional photodetectors use photon multiplier tubes
(PMTs) which are bulky, subtle, sensitive to magnetic
fields and require high-supply voltage [6]. The photo-
diode used in the photodetector requires being highly
sensitive, enabling the reliable conversion of the ultra-
low amplitude light signal into a detectable electric sig-
nal. Silicon avalanche photodiode (SiAPD) is a potential
candidate for low-level light detection in the visible and
near-infrared regions due to its bias dependent internal
Copyright © 2012 SciRes. OPJ
E. KAMRANI ET AL.
302
gain and its ability to amplify the photogenerated signal
by avalanche multiplication [7].
The SiAPDs fabricated in dedicated process have two
major disadvantages: the production cost is very high due
to the specialized fabrication process, and the impossibil-
ity to integrate electronic circuits on the same chip. Op-
timizing the performance of both the CMOS devices and
the SiAPD is a challenging task. To overcome these
problems, researchers have investigated the design and
fabrication of SiAPDs in a standard CMOS process [8,9].
The advantages of standard CMOS fabrication process
are: the availability of a fully supported, mature and re-
liable technology at reasonably low cost, and the possi-
bility of developing a complete system on chip with a
high degree of complexity [10-12].
The mandatory requirement for SiAPD fabrication in
standard CMOS process is that a suitable subset of
CMOS fabrication process flow should be able to build a
planar p-n junction without device breakdown at the
photodiode periphery. SiAPDs fabricated using standard
CMOS process involves high doped p or n layer resulting
in shallow or medium depth depletion region. As a con-
sequence, CMOS SiAPDs are inefficient to detect red
and NIR photons, and are not suitable for NIR signal
detection in neuroimaging. However, to increase the use
of SiAPD-based front-end receivers for biomedical ap-
plications, integration of the SiAPD and peripheral cir-
cuitry on the same chip using standard CMOS technol-
ogy is highly desired. The fabrication of SiAPDs in
standard CMOS technology permits fabrication of both
the photodetector and the necessary peripheral circuits on
the same chip for an integrated system. This leads to fea-
sibility of implementation of a portable brain imaging
system which is highly desired. However, it is challeng-
ing to make SiAPDs in CMOS technology due to lack of
special fabrication steps [9], the punch-through, high
tunneling and premature edge breakdown (PEB) effects
[10,13] and also the trade-offs between several design
parameters such as scale, shape, doping, noise, efficiency,
gain, speed, etc.. High-level noise and low-efficiency of
the currently available detectors [7,8], encourages us to
design a new SiAPD with low-noise and high detection
efficiency at NIR region [13-15].
Here we have designed the p+/n-well SiAPDs with
different guard rings (n-well and p-well) in different
shapes and scales. These provide a tradeoff between fill
factor and angularity and a feasible way to validate the
efficiency of the applied guard-rings. The p-well APD is
a p+/n-well APD developed in square and octagonal
shape with p-well guard ring to preventing PEBs. The
guard ring is achieved by low doped p-well around p+
active area with 100 µm diameter (Figure 2(a)). Another
new photodiode (APD2) which is an n+/p-sub SiAPD
with n-well PEB prevention (PEBP) technique (Figure
2(b)). It uses the connection between the highly doped n
region and the substrate as the active region. Optimiza-
tion of the performance of SiAPD is done by device level
simulation using Sentaurus TCAD software. The active
junction of the photodiode exists between p + (Na = 5 ×
1019/cm3) and deep n-well (Nd = 1.28 × 1017/cm3). The
main characteristics of these APDs are shown in Table 1.
The photon detection probability (PDP) and the sensitiv-
ity of the APDs also are plated and compared in Figure 3.
The results show a higher PDP and sensitivity of the
p-well APD comparing to APD2.
3. Geiger-Mode Front-End Implementation
A diode working in the region near the breakdown volt-
age can be applied in two different modes of operations:
Proportional (linear or amplification) mode and Geiger
(digital or trigger) mode. In Geiger mode, SiAPDs work
as trigger devices rather than amplifying devices. For
operating the SiAPD in Geiger mode (single photon
counting mode) quenching and reset circuits are neces-
sary. Generally three types of quenching circuits have
been used for Geiger mode operation: passive, active and
mixed quenching circuits.
Passive quenching (PQ) is suitable for APDs having
small area and small RC time contacts since it can be
operated at higher speed. The schematic of two possible
configurations of passive quench circuits [16-20] are
shown in Figure 4. In Figures 4(b) and (c) the APD
cathode voltage and current in response to single photon
arrival are plotted. They can also be used with large area
devices where high counting rates are not a requirement.
Since we require large area APDs for our application that
is expected to count photons at high-speed (1 MHz), PQ
is not a feasible option.
p-sub
n-well
n+ n+
p+
(active area)
D eep n-w ell
poly polyMetal RingMeta l Ring
n-welln-wellp-wellp-well
(a)
p-sub
n-well
n+ n+
p+
(active area)d
Deep n-w ell
poly polyMetal RingMetal Ring
n-well
d
n-well
(b)
Figure 2. Cross-section of the proposed APDs: (a) The p-
well (APD1) and (b) The p-sub (APD2).
Copyright © 2012 SciRes. OPJ
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Copyright © 2012 SciRes. OPJ
303
Table 1. The characteristics of the proposed SiAPDs.
SiAPD
p-well (APD1) p-sub (APD2)
Reference
Parameter
Rectangular Rectangular Rectangular Octagonal
Linear Gain 200 220 140 100
Area(~µm2) 100 × 100 400 × 400 100 × 100 100 ×100
PDE
@550 nm 45% 75% 22% 52%
F@M = 20 89@800nm 60@800nm 59@800nm 138@800nm
Impedance () 600 600 0.5 0.5
Capacitance 1pF 30 pF 1pF 1pF
(a)
(b)
Figure 3. Comparison of different implemented APDs: (a) PDP and (b) Sensitivity.
of the circuit does not depend on the component values
and can be accurately controlled, hence determination of
precise dead time is possible for satisfactory circuit op-
eration [12]. However, it is difficult to design an effec-
tive AQC and it needs extra and complicated ultra-pre-
cise circuitry to reduce propagation delays as well as
stray capacitances.
In order to achieve faster quenching, active quenching
circuit (AQC) is used [11]. This method forces back on
the APD to drop the bias voltage much quicker enabling
significant speed improvements over the PQ method. It
causes high accuracy in photon timing. Small delay in
quenching the avalanche resulting in fewer carriers
crossing the junction and hence low false re-triggering of
avalanche (lower after pulse). This also results in lower
power loss and hence less heating of the APD. Dead time
Using proposed mixed quench circuit (MQC), depicted
in Figure 5 [12], reduces the required size of load resistor
E. KAMRANI ET AL.
304
Comp
arator
RL
Rs
Vdd
SPAD
SPAD
Comp
arat or
Rs
RL
-Vdd
(a)
0.054
0.056
0.058
0.06
0.062
0.064
0.066
02E-09 4E-09 6E-09 8E-09 1E-08
Vout (mV)
Time
(b)
0.00E+000
2.00E-011
4.00E-011
6.00E-011
8.00E-011
1.00E-010
1.20E-010
1.40E-010
0.00E+000 5.00E-0091.00E-008
Iout(A)
Time
(c)
Figure 4. Schematic of the passive quench circuit in two
possible voltage and current mode configurations (a) and
the APD cathode voltage (b) and current (c) in response to
single photon arrival.
(RL) and so the power consumption, charge trapping,
after-pulsing and the optical crosstalk and also improve
the performance by quicker detection of the photon in a
wider dynamic range optical input.
In order to operate the single photon avalanche photo-
diode (SAPD) in Geiger mode for single photon counting,
a quenching circuit and a reset circuit are designed in this
stage to be used along with the photodiode. A new, fast,
low-noise and high efficient quenching and a reset circuit
are designed in this stage by combination of previously
applied active and passive techniques. This circuit used
along with the photodiode in Geiger mode for higher
performance single-photon counting.
In order to make the avalanche quenching as fast as
possible, we apply the MQC, as a hybrid approach. Fig-
ure 5 shows the block diagram of the mixed passive-
active quenching circuit proposed in [12]. Here, passive
quenching is used as the first stage to limit the avalanche
current to a low value, followed by the application of a
quench pulse during the quench delay time and a reset
pulse to recharge the SPAD back to the reverse bias vol-
tage higher than breakdown voltage (VBR).
This method adopts a simpler design while still allow-
ing some control over the dead time and the use of a vol-
tage pulse to speed up quenching. The value of the load
resistor that provides the initial passive quenching action
can be lower as compared to pure PQ since the actual
quenching is done by AQC block [12]. However, the
switching delays related to the relatively large parasitic
capacitances and high value PQ resistance of the circuit
limit the performance and quenching speed of the MQC
and it needs more extra complicated circuitry and extra
size, but still simpler and with a better performance
comparing to the AQC.
Here we develop a new controllable MQC with lower
power and lower complexity accompanying with more
flexibility and dynamic range of operation by developing
an adaptive and faster hold-off time control on the pre-
viously proposed MQC. The circuit diagram of the AQC
mixed with PQC is shown in Figure 6. In quiescence
condition, the cathode of SPAD is biased to Vdd (usually
5% - 10% above the breakdown voltage for achieving
higher sensitivity) through R1 and is ready to detect a
photon. The onset of the avalanche current starts a pas-
sive quenching action and the voltage drop across R1
reduces the voltage at the SPAD cathode. As such, Ssense
goes in deeper conduction and the voltage drop caused
by R3, turns the quench transistors (Squench1 and Squench2)
ON via Sfeedback. This starts the active quenching action by
quickly pulling the SPADs cathode down to ground. This
brings the reverse bias of the SPAD below breakdown
Figure 5. Mixed passive-active quenching circuit proposed
by [12].
Copyright © 2012 SciRes. OPJ
E. KAMRANI ET AL. 305
Reset
Monostable
Gate
Vop
H o ld -o ff
Monostable
R2
R1
R3
Sreset1 Sreset2 Sreset3
Ssense
Squench1
Squench2Sfeedback
Vdd
SPAD out
Gating
Cir cuit
SPAD
+
A
(a)
(b)
(c)
Figure 6. Schematic diagram of the controlled mixed
quenching circuit (a) and the APD cathode voltage in re-
sponse to single photon arrival (b) and multiple-photon
arrivals between 35 ns - 80 ns (c).
and the avalanche current quickly dissipates. The quench
transistors (Squench1 and Squench2) are then turned OFF and
the three parallel reset transistors (Sreset1, Sreset2, and Sreset3)
are turned ON.
The reset transistors are activated by an output pulse
from the reset monostable which triggers with the end of
the hold-off period. These reset transistors are equivalent
of the three low resistance transistors, which resets the
quiescent bias of the SPAD and brings the SPAD cathode
voltage back to detect the next photon. Short duration of
the reset-time decreases the dead-time between photon
counts [21-23].
Note that in this circuit the excess voltage
E
V, is
given by:
E
ddop BR
VVV V  (1)
where the bias voltage is provided by circuit supply
voltage
dd
V and a DC voltage connected to
the APD anode. The SPAD performance is directly pro-
portional to the amount of the excess electric bias voltage
above the breakdown voltage. So in additional to the
mentioned preferences, MQC can improve the perform-
ance comparing to the PQC, due to the significant influ-
ence of the

op
V
E
V on detector performance.
Using this circuit, faster quenching results in lower
power loss and hence less heating of the SPAD can be
achieved. High power dissipation can drift the break-
down voltage, and change the SPAD response regarding
to the detection efficiency and noise. Delayed release of
trapped charges due to the large charge trapping in SPAD
can retrigger the detector and cause false ignitions (after-
pulsing). After-pulsing cause a non-linear distortion in
photon counting [18]. Decreasing the avalanche time
duration reduces the power dissipation, charge trapping
and the optical crosstalk due to the minimization of the
hot-carrier photon-emission [16,17].
Because of the complementary action of the AQC in
MQC in order to suppress more the initially quenched
avalanche by the PQC, there is more flexibility in choos-
ing the PQ load (RL). Therefore by reducing the load
resistor RL one can achieve a quicker detection of the
photon [17]. By increasing the light intensity received by
the APD, the current flow through the diode and the se-
ries connected resistor (RL) will also increase. The re-
sulting increased voltage across RL, decreases the bias
voltage across the APD, so that the gain of the APD is
reduced. Therefore the dynamic range of optical input of
the APD will be increased for a fixed dynamic range of
output voltage [18].
Here also in order to improve the integrity and com-
pactness, and in order to reduce the power consumption
due to the large size of the load resistor in passive quench
circuit, the passive quenching is embeded in a CMOS
APD structure by adding resistor at the top side of the
cathode of photodiode CMOS layout cross-section.
4. Linear Mode Front-End for CW-fNIRS
Based on the mode of operation, we need several ampli-
fiers and processing blocks to operate the photodetector
[13]. For linear mode operation, SiAPD requires a tran-
simpedance amplifier (TIA) to convert the input photo-
current into a voltage signal [24,25]. The bias of an APD
just near but below a breakdown voltage is referred to as
a linear mode operation. At this bias voltage, the gain is
high, and the output signal is proportional to the amount
Copyright © 2012 SciRes. OPJ
E. KAMRANI ET AL.
Copyright © 2012 SciRes. OPJ
306
of scintillation light interacting in the APD. Here we
need a transimpedance amplifier in order to amplify the
APD current.
able-gain transimpedance amplifiers are difficult to stabi-
lize. The key problem with these designs is that they are
based on the traditional two-stage topology consisting of
a common-source gain stage followed by an output buf-
fer. Phang et al. [5] proposed a TIA combining a sub 1-V
current mirror [5,14] and a common-gate TIA based on a
current-gain amplifier for optical communication. Achi-
gui et al. [4] modified this TIA by adding an Operational
Transconductance Amplifier (OTA) with dynamic thres-
hold transistor (DTMOS) for NIRS front-end photore-
ceiver. All of these designs are based on fixed-gain and
only one mode of operation. Reaching high data-rate and
high-BW in these designs is also with the cost of small
gain, high noise and power-consumption. So the needs
for a new design with the ability to overcome these limi-
tations and cover the requirements for a fNIRS photo-
detector front-end, is a critical issue which we address in
this paper. In resistive-feedback TIA (RF-TIA), the tran-
simpedance gain is high and offers the smallest noise
specially at high frequencies comparing to other struc-
tures, but its BW is limited. Capacitive-feedback TIA
(CF-TIA), offers smaller noise at low frequencies but it
is noisy at higher frequencies [36,37]. A common-gate
configuration is typically chosen as it can tolerate a wide
range of SiAPD capacitance. However, resistive feed-
back architecture has better noise performance and is
more attractive when SiAPD models are readily available.
Due to the ultra low level and usually high source im-
pedance of fNIRS signals, this amplifier should be estab-
lished to meet certain basic requirements and must cope
with various challenges in order to extract the biopoten-
tial signals. The challenges of designing such a TIA
for portable biopotential acquisition systems are: High
Common Mode Rejection Ratio (CMRR) to reject inter-
ference [15], High-Pass Filter (HPF) characteristics for
filtering differential DC electrode offset [17], low-noise
for high signal quality [18], ultra-low power dissipation
(<50 mW) for long-term power autonomy, configur-
able gain and filter characteristics that suit the needs of
different biopotential signals and different applications,
high transimpedance gain (>1 k) [26], narrow Bandwidth
(around 100 k), high output swing, wide dynamic range,
ambient light rejection, and low-voltage operation [13].
There are mainly three TIA structures reported in lit-
erature: common-gate TIA, resistive feedback TIA, and
capacitive feedback TIA.
Figure 7 shows the schematic of three configurations
while the detail description of them can be found in [12].
Common-gate TIA(CG-TIA), usually used in open-loop
topology and exhibits low input impedance and high
transimpedance gain, however its input noise current
and input bias current are high and its BW is also low.
Here we have proposed three new TIAs. The first
structure (Figure 8) is a combination of common-gate
TIA (CG-TIA) and RF-TIA. This new structure offers a
low-noise, high-gain and high-BW TIA. The design con-
sists of a current amplifier implemented in a transim-
pedance configuration. In this circuit (Figure 8), we have
used the combination of M6-M9 transistors to act as a
feedback resistor to minimize the output ripple and omit
the extra drawn current. The DC transimpedance gain
and the GBW are given by:
Besides so much works [31-35] on developing a proper
photoreceiver amplifier, designing such a proper dedi-
cated front-end for fNIRS has not been considered in the
literature yet and none of the reported NIRS detectors
provide these features taken together, which is a crucial
factor in real-time brain imaging.
Available proposed amplifiers for this case are suffer-
ing from a lot of limitations so that trade-off between
necessary parameters occurs with the cost of losing reli-
ability and performance. For example reported vari-
(a) (b) (c)
Figure 7. Different TIA structures: (a) Common-gate; (b) Resistive feedback; and (c) Capacitive feedback.
E. KAMRANI ET AL. 307
M4
M2
M1
M3
VDD
M6
M7
CDM5
M8
Vbias1
Vbias2
Vbias3
Vbias4
Iin
Vcont
OTA TIA
LA
and
Filter
Vout
TIA
M9
Vbias5
Figure 8. Schematic of the proposed TIA front-end (TIA1).




5
45
11 5
11
5
4
1;
1;
Mf
out
inM M
ms mf
inmsLf fcm
m
cm m
R
g
V
Igg
gg gR
GBW CggCCRK
g
Kg


 



(2)
where gmi is the transconductance and Rf is the feedback
resistance implemented by M6, M7 and M9 biased in the
linear region. Bandwidth of TIA increases by decreasing
the
D
C (~1 pF). In order to boost the voltage swing and
match the output impedance to drive the photoreceiver
output, a Limiting Amplifier (LA) [12] and a current-
mirror OTA [13] are used at the output of the TIA. Using
the constant applied voltage of ,
the Gain, BW, power-consumption and dynamic range of
the output stage could be changed in a wide desirable
output range.
cont
0V 2V
cont
VV
The OTA used in the proposed front-end amplifier de-
sign is a current-mirror OTA, which is modified from
OTA reported in [3]. Performance of this OTA which is
shown in Figure 9 is highly dependent on the bias cur-
rent (, and the sizing of the transistors. We have consid-
ered these two parameters fairly in order to reach best
performance. In order to boost the voltage swing and
match the output impedance to drive the photoreceiver
output (usually a counter or an analog-to-digital-con-
verter), a LA [6] for post amplification is added to the
output of the OTA.
To increase the maximum output swing, and improve
the stability of the circuit, we have used a filtering block
followed by TIA and LA (Figure 8). As mentioned be-
fore, one of the main requirements of biosignal ampli-
fiers is to have a wide dynamic range. In order to achieve
wide dynamic range, we have considered the proposed
photoreceiver circuit as shown in Figure 8 by adding the
ability of parameters tuning. Using the constant applied
voltage cont , the Gain, BW, power-consumption and
dynamic range of the output stage could be changed in a
wide desirable output range.
V
Figures 10(a)-(c) show the transimpedance gain, the
input and output noise of the proposed circuit in function
of frequency variation. Measurements show that the in-
put noise is very low compared to the existing TIAs.
Measured output noise is 1.8 µv/Hz. The power con-
sumption of the front-end circuit is also very low. The
TIA has high transimpedance gain and high bandwidth.
The simulation and measurement results of the pro-
posed circuit verify its efficiency and reliability for
fNIRS system. By varying the cont
V in proposed vari-
able-gain front-end (Figure 11), between 0 - 1.5 V, we
reached the very-high and fixed value of 45 × E9 for
gain-bandwidth product (GBW). This value is tuneable
between 10 M and 45 G for various applications. We can
reach the transimpedance gain in the range of 2 - 400
MV/A and BW in the range of 1.7 - 5 MHz using this
configuration. The power consumption of this circuit is
in the range of 0 - 3 mW, which is very convenient for
biomedical portable applications. Referring to Table 2,
the input noise of the proposed design is one of the low-
est reported input noises comparing to all similar photo-
receiver amplifiers. Measured output noise is also 1.8
µv/Hz. The output pulse with the maximum swing of
3.3 V is also one of the best indexes to show the appro-
priateness of the proposed design. In order to verify the
effect of the supply voltage, we have also tested the tu-
neable-gain configuration by increasing the supply volt-
age to 1 V.
The second TIA structure is a four-stage TIA depicted
in Figure 12. For cascade TIA in order to reduce the
relative noise contribution of the subsequent amplifier
stages, the SNR of the first stage should be tuned to be as
Copyright © 2012 SciRes. OPJ
E. KAMRANI ET AL.
308
VDD
M7
M8
M5
M3
M6 M4 M9
M2
M1
M12
M10
M11
Vcont
Vout
Vi n
Figure 9. Schematic of the OTA (M1, M2, M9, M10: W/L =
2/0.35 M11, M12: W/L = 10/0.35 and for all other transis-
tors W/L = 1/0.35).
2
4
6
8
10
1E+0
3E+0
1E+1
4E+1
1E+2
5E+2
2E+3
6E+3
2E+4
7E+4
3E+5
9E+5
3E+6
1E+7
4E+7
1E+8
4E+8
Gain(MV/A)
Freq(Hz
)
(a)
0.0 E+00
2.0E-10
4.0E-10
6.0E-10
8.0E-10
1.0E-09
1.2E-09
1.4E-09
1E+0
5E+0
3E+1
1E+2
8E+2
4E+3
2E+4
1E+5
6E+5
3E+6
2E+7
8E+7
4E+8
Input Noise(A/sqrt(Hz))
Freq(Hz)
(b)
0.0E+0
5.0E-7
1.0E-6
1.5E-6
2.0E-6
1E+0
5E+0
3E+1
1E+2
8E+2
4E+3
2E+4
1E+5
6E+5
3E+6
2E+7
8E+7
4E+8
Output Noise(V)
Freq(Hz)
(c)
Figure 10. The gain (a), the input noise (b) and the output
noise (c) of the proposed circuit shown in Figure 8 at dif-
ferent frequencies.
0.0E+0
5.0E-4
1.0E-3
1.5E-3
2.0E-3
2.5E-3
3.0E-3
3.5E
-
3
Power Consumption(W)
Vcont (V)
Figure 11. Power-consumption variation with different con-
trol voltages.
Figure 12. Schematic of the second proposed TIA (TIA2).
large as possible so the feedback transistor (Mf) is placed
in series with Rf to reduce the input noise of the TIA by
applying different control voltage via Vcont. Using the
constant applied voltage of cont at each stage, the Gain,
BW, power-consumption and dynamic range of the out-
put could be changed in a vast desirable output range.
The DC gain and the BW of a single stage are equal to:
V
12 12
3123 3
1
;BW2π
mm mmi
i
mdsdsds min
g
ggg
AA
g
ggg gRC



(3)
where A is the gain and is the input capacitance of
each stage.
in
C
In order to achieve best performance in our design, we
have analyzed the sensitivity of each component pre-
sented in our design and the best values for optimal siz-
ing are selected. Figure 13 shows the TIA gain. The out-
put voltage regarding to the sinusoid input with ampli-
tude of 10 µA and its frequency response is depicted at
Figures 14(a) and (b) respectively. The input and output
noises are shown in Figure 15.
A novel logarithmic TIA (TIA3) also has been de-
signed as depicted in Figure 16 [38,39]. The later TIA is
useful in systems that need scale-invariant and wide dy-
namic range operation. Its sensitivity to the contrast (AC/
DC) of the input and its scale-invariant fractional amplifi-
cation is beneficial in several applications where per-
centage changes rather than absolute changes carry infor-
mation. The previously reported applications of loga-
rithmic TIA in the photodetectors are very limited. But
no application of such TIA for fNIRS system has been re-
ported yet in the literature. Here we have proposed a new
Copyright © 2012 SciRes. OPJ
E. KAMRANI ET AL.
Copyright © 2012 SciRes. OPJ
309
0.00E+00
5.00E+07
1.00E+08
1.50E+08
2.00E+08
2.50E+08
3.00E+08
freq (Hz)
3.311
11.22
38.02
128.8
436.5
1.48E+03
5.01E+03
1.70E+04
5.75E+04
1.95E+05
6.61E+05
2.24E+06
7.59E+06
2.57E+07
8.71E+07
2.95E+08
Gain(V/A)
Freq (Hz)
Figure 13. The TIA gain.
0
2
4
6
8
1.0E+0
5.2E+0
2.8E+1
1.4E+2
7.6E+2
4.0E+3
2.1E+4
1.1E+5
5.8E+5
3.0E+6
1.6E+7
8.3E+7
4.4E+8
Vout(V)
Freq (Hz)
2.2
2.21
2.22
2.23
2.24
2.25
0.0E+ 0
3.0E-10
1.8E-9
3.4E-9
5.0E-9
6.6E-9
8.2E-9
9.8E-9
1.1E-8
1.3E-8
1.5E-8
1.6E-8
1.8E-8
1.9E-8
Vout(V)
Time(s)
(a) (b)
Figure 14. The output voltage (a) and the frequency response of the output stage (b).
0.0E+0
5.0E-10
1.0E-9
1.5E-9
2.0E-9
2.5E-9
3.0E-9
1.0E+0
5.2E+0
2.8E+1
1.4E+2
7.6E+2
4.0E+3
2.1E+4
1.1E+5
5.8E+5
3.0E+6
1.6E+7
8.3E+7
4.4E+8
Input
Noise (A /sq r t (Hz))
Freq(Hz)
0.0E+0
5.0E-4
1.0E-3
1.5E-3
2.0E-3
1.0E+ 0
5.2E+ 0
2.8E+ 1
1.4E+ 2
7.6E+ 2
4.0E+ 3
2.1E+ 4
1.1E+ 5
5.8E+ 5
3.0E+ 6
1.6E+ 7
8.3E+ 7
4.4E+ 8
Output
Noise(V/sqrt(Hz))
Freq(Hz)
(a) (b)
Figure 15. The input noise (a) and the output noise (b) of the proposed circuit.
5. Integrated Photoreceiver Front-End
topology to be applied in fNIRS photodetector front end.
In this circuit, M1 act as the logarithmic amplifier
transistor, M6-M7 provides the feedback resistor. M9
acts as a feedback transistor placed directly across the
input and output terminals of the current mirror. Using
this direct feedback topology, decrease the input imped-
ance seen by the photodiode and improve the speed of
the circuit by the cost of the lower output swing. Using
logarithmic amplifier makes also the response to a fixed
image contrast invariant to absolute light intensity and
improves the dynamic range of the photodetector. The
performance of the proposed TIA comparing with other
works is shown in Table 2. Here we have defined the
figure of merit (FOM) as GBW/Power dissipation
The developed photodiode was integrated with photo-
detection circuitry and control unit using standard CMOS
0.35 µm technology in order to implement a one-channel
photoreceiver including circuits for both linear and Gei-
ger mode. The layout and microphotograph of the de-
signed integrated circuit are depicted in Figure 17. This
IC only includes the TIA1, TIA2 and the APDs. This IC
has been fabricated by TSMC via CMC Microsystems. In
order to verify the effect of on-chip integration of APD
and TIA, the characteristics of the integrated circuits and
devices are measured and compared with discrete com-
ponents (off-chip separated). Figure 18 shows the main
characteristics of the SiAPDs, normalized for better com-
parison. The results also show that the main effects of
ntegration are increasing the SNR and sensitivity, while
[GHz/mW] to evaluate the efficiency of the proposed
TIAs comparing to other works. i
E. KAMRANI ET AL.
310
M4
M2
M1
M3
VDD
M6
M7
M5
M8Vbias1
Vbias2
Vbias 3
Iin
Vout
Log Amp
M10
M9
Vcnt
AGC
Peak
Detector
Figure 16. Proposed logarithmic third TIA (TIA3) with ambient light rejection and AGC loops.
Table 2. Comparison of the proposed TIAs with different works.
Ref Tech Supply voltage (V) Power diss. (mW)Max gainBW
(MHz)
Input noise at
1 kHz (A/Hz)
GBW/power dis.
(GHz /mW)
[3] 0.35 1 1 210 k 50 11 p 10,500
[4] 0.6 3 30 8.7 k 500 4.5 p 145
[8] 0.35 2.5 0.14 1.5 k 110 Hz - 0.001
[9] 0.18 2 7.2 6.3 k 2500 <10 p 2190
TIA1 0.35 3 0.8 250 M 1000 100 f 312.5 M
TIA2 0.35 3 4 200 M 100 K-1280 f 62,500
TIA3 (simulation) 0.35 3 0.2 300 M 2000 50 f -
it doesn’t have any significant effect on gain.
6. Conclusion
This paper proposed a miniaturized, reconfigurable and
low-noise light detector. It includes low voltage, high
efficiency, high-gain avalanche photodiodes in different
topologies with maximum sensitivity and minimum noise
using standard CMOS 0.35 µm technology. Three new
high GBW and low-noise TIA are introduced based on
distributed gain concept to be applied in linear operation
mode. A high-speed photon counting system includes an
ultra-fast quench-reset circuit, pulse generator, monosta-
ble and counter with small quenching time and controlla-
ble reset time is also proposed. All the components have
been designed and evaluated based on the simulation and
layout implementation in CADENCE and TCAD. The
main characteristics of the APDs are also validated and
the impact of each parameter is studied based on the
simulation results. The quench-reset circuitries and new
implemented APDs with boosted quality and improved
efficiency are also currently fabricated and we are now
working on test and measurement of these components to
Copyright © 2012 SciRes. OPJ
E. KAMRANI ET AL. 311
1.5 mm
2 m
(a)
1.5 mm
2 mm
APD
400 × 400 μm
2
Front-end
circuits
APDs
100 × 100 μm
2
(b)
Figure 17. The layout (a) and microphotograph (b) of the fabricated IC.
Copyright © 2012 SciRes. OPJ
E. KAMRANI ET AL.
312
0
0.2
0.4
0.6
0.8
1
1.2
Sensitivity SNRNoiseGainPowe
r
Normalized Units
AP D1: 10 0um
AP D1: 40 0um
AP D2: R ect.
AP D2 : Oct.
Figure 18. Validation the integration effect on APDs efficiency.
be integrated with the proposed TIAs.
7. Acknowledgements
We gratefully acknowledge the financial support from
the Canadian Institutes of Health Research (CIHR) and
the Heart and Stroke Foundation of Canada then the
Canada Research Chair in smart medical devices and
CMC Microsystems.
REFERENCES
[1] J. G. Webster, “Medical Instrumentation, Application and
Design,” John Wiley & Sons Inc., Hoboken, 2010.
[2] R. F. Yazicioglu, C. Van Hoof and R. Puers, “Biopoten-
tial Readout Circuits for Portable Acquisition Systems,”
Springer, Berlin, 2009. doi:10.1007/978-1-4020-9093-6
[3] V. Peluso, P. Vancorenland, M. Steyaert and W. Sansen,
“900 mV Differential Class AB OTA for Switched Opamp
Applications,” Electronics Letters, Vol. 33, No. 17, 1997,
pp. 1455-1456. doi:10.1049/el:19970964
[4] H. F. Achiguia, M. Sawana and C. J. B. Fayomi, “A
Monolithic Based NIRS Front-End Wireless Sensor,”
Microelectronics Journal, 39, 10, 2008, pp. 1209-1217.
doi:10.1016/j.mejo.2008.01.055
[5] K. Phang, “CMOS Optical Preamplifier Design Using
Graphical Circuit Analysis,” PhD Thesis, Department of
Electrical and Computer Engineering, University of To-
ronto, Toronto, 2001.
[6] B. Wilson and J. D. Drew, “Novel Transimpedance Am-
plifier Formulation Exhibiting Gain-Bandwidth Inde-
pendence,” IEEE International Symposium on Circuits
and Systems, Vol. 1, 1997, pp. 169-172.
doi:10.1109/ISCAS.1997.608649
[7] B. Razavi, “A 622Mb/s 4.5 pA/Hz CMOS Transim-
pedance Amplifier,” IEEE International Solid-State Cir-
cuits Conference, San Francisco, 7-9 February 2000, pp.
162-163. doi:10.1109/ISSCC.2000.839732
[8] M. Ingels and M. Steyaert, “A 1-Gbit/s, 0.7-µm CMOS
Optical Receiver with Full Rail-to-Rail Output Swing,”
IE EE J ournal of Solid State Ci rcuits, Vol. 34, No. 7, 1999,
pp. 971-977. doi:10.1109/4.772412
[9] I. Song, “Multi-Gbit/s CMOS Transimpedance Amplifier
with Integrated Photodetector for Optical Interconnects,”
A Ph.D. Thesis Presented to The Academic Faculty,
Georgia Institute of Technology, Atlanta, 2004.
[10] M. Nakamura and N. Ishihara, “1.2V, 35 mW CMOS
Optical Transceiver ICs for 50 Mbit/s Burst-Mode Com-
munication,” Electronic Let ters, Vol. 35, No. 5, 1999, pp.
394-395. doi:10.1049/el:19990270
[11] Q. Yang, “Design of Front-End Amplifier for Optical
Receiver in 0.5 Micrometer CMOS Technology,” MSc
Thesis, University of Hawai, Hawai, 2005.
[12] F. Zappa, S. Tisa, A. Tosi and S. Cova, “Principles and
Features of Single-Photon Avalanche Diode Arrays,”
Sensors and Actuators A, Vol. 140, No. 1, 2007, pp. 103-
112. doi:10.1016/j.sna.2007.06.021
[13] E. Kamrani, F. Lesage and M. Sawan, “Premature Edge
Breakdown Prevention Techniques in APD Fabrication,”
The 10th IEEE International NEWCAS Conference, Mon-
treal, 17-20 June 2012, Montreal, pp. 345-348.
doi:10.1109/NEWCAS.2012.6329027
[14] E. Kamrani and M. Sawan, “Fully Integrated CMOS Ava-
lanche Photodiode and Distributed-Gain TIA for CW-
fNIRS,” The IEEE Biomedical Circuits and Systems Con-
ference (BioCAS2011), San Diego, 10-12 November 2011,
pp. 317-320. doi:10.1109/BioCAS.2011.6107791
[15] E. Kamrani, A. Sultana and M. Sawan, “Tunable, Low-
Power, High-Gain Transimpedance Amplifier for fNIRS
Photoreceiver Front-End,” The 54th IEEE International
Midwest Symposium on Circuits and Systems (MWSCAS),
Seoul, 7-10 August 2011, pp. 1-4.
doi:10.1109/MWSCAS.2011.6026338
[16] M. Razeghi, “Technology of Quantum Devices,” Springer
Press, London, 2010. doi:10.1007/978-1-4419-1056-1
[17] E. Kamrani, S. H. Andy Yun, F. Lesage and M. Sawan,
“Near Infra-Red Light Detection Using Silicon Avalanche
Photodiodes: Design Challenges in Standard CMOS Tech-
nology,” Proceedings of SPIE, MIOMD-XI: 11th Inter-
national Conference on Infrared Optoelectronics: Mate-
Copyright © 2012 SciRes. OPJ
E. KAMRANI ET AL. 313
rials and Devices, Chicago, 4-8 September 2012.
[18] B. Huang, X. Zhang and H. Chen, “1 Gb/s Zero Pole
Cancellation CMOS Transimpednace Amplifier for Giga-
bit Ethernet Applications,” Journal of Semiconductors,
Vol. 30, No. 10, 2009.
[19] S. Cova, “Active Quenching Circuit for Avalanche Pho-
todiodes,” US Patent 4,963,727 (Italian Patent 22367A/
88); Licensed for Industrial Production to Silena SpA,
Milano, 1990.
[20] Y. Kim, I. Jun and K. H. Kim, “Design and Characteriza-
tion of CMOS Avalanche Photodiode with Charge Sensi-
tive Preamplifier,” IEEE Transactions on Nuclear Sci-
ence, Vol. 55, No. 3, 2008, pp. 1376-1380.
doi:10.1109/TNS.2008.924063
[21] E. Roncali and S. R. Cherry, “Application of Silicon
Photomultipliers to Positron Emission Tomography,” An-
nals of Biomedical Engineering, Vol. 39, No. 4, 2011, pp.
1358-1377. doi:10.1007/s10439-011-0266-9
[22] S. Tisa, F. Zappa, A. Tosi and S. Cova, “Electronics for
Single Photon Avalanche Diode Arrays,” Sensors and
Actuators A, Vol. 140, No. 1, 2007, pp. 113-122.
doi:10.1016/j.sna.2007.06.022
[23] S. Tisa, A. Tosi and F. Zappa, “Fully-Integrated CMOS
Single Photon Counter,” Optics Express, Vol. 15, No. 6,
2007, pp. 2873-2887. doi:10.1364/OE.15.002873
[24] V. Peluso, P. Vancorenland, M. Steyaert and W. Sansen,
“900 mV Differential Class AB OTA for Switched Opamp
Applications,” Electronics Letters, Vol. 33, No. 17, 1997,
pp. 1455-1456. doi:10.1049/el:19970964
[25] B. Wilson and J. D. Drew, “Novel Transimpedance Am-
plifier Formulation Exhibiting Gain-Bandwidth Inde-
pendence,” IEEE Proceedings of International Sympo-
sium on Circuits Systems, Vol. 1, 1997, pp. 169-172.
[26] M. Tavakoli, L. Turicchia and R. Sarpeshkar, “An Ul-
tra-Low-Power Pulse Oximeter Implemented with an En-
ergy-Efficient Transimpedance Amplifier,” IEEE Trans-
actions on Biomedical Circuits and Systems, Vol. 4, No. 1,
2010, pp. 27-38. doi:10.1109/TBCAS.2009.2033035
[27] T. H. Lee, “The Design of CMOS Radio-Frequency Inte-
grated Circuits,” Cambridge University Press, Cambridge,
1998. doi:10.1017/CBO9780511817281
[28] R. Sarpeshkar, R. F. Lyon and C. A. Mead, “A Low-
Power Wide-Dynamic-Range Analog VLSI Cochlea,”
Analog Integrated Circuits and Signal Processing, Vol.
16, No. 3, 1998, pp. 245-274.
doi:10.1023/A:1008218308069
[29] Q. Yang, “Design of Front-End Amplifier for Optical
Receiver in 0.5 Micrometer CMOS Technology,” MSc
Thesis, University of Hawai, Hawai, 2005.
[30] W.-Y. Choi, M.-J. Lee and J.-S. Youn, “Si Integrated
Photoreceivers,” 2010 IEEE Bipolar/BiCMOS Circuits
and Technology Meeting (BCTM), Austin, 4-6 October
2010, pp. 77-81. doi:10.1109/BIPOL.2010.5667948
[31] S. Radovanovic, A.-J. Annema and B. Nauta, “A 3Gb/s
Optical Detector in Standard CMOS for 850 nm Optical
Communication,” IEEE Journal of Solid-State Circuits,
Vol. 40, No. 8, 2005, pp. 1706-1717.
doi:10.1109/JSSC.2005.852030
[32] W.-Z. Chen, S.-H. Huang, G.-W. Wu, C.-C. Liu, Y.-T.
Huang, C.-F. Chiu, W.-H. Chang and Y.-Z. Juang, “A
3.125 Gbps CMOS Fully Integrated Optical Receiver
with Adaptive Analog Equalizer,” Proceedings of IEEE
Asian Solid-State Circuits Conference, Jeju, 12-14 No-
vember 2007, pp. 396-399.
doi:10.1109/ASSCC.2007.4425714
[33] F. Tavernier and M. Steyaert, “Power Efficient 4. 5 Gbit/s
Optical Receiver in 130 nm CMOS with Integrated Pho-
todiode,” Proceedings of European Solid-State Circuits
Conference, Edinburgh, 15-19 September 2008, pp. 162-
165.
[34] W.-Z. Chen and S.-H. Huang, “A 2.5 Gbps CMOS Fully
Integrated Optical Receiver with Lateral PIN Detector,”
Proceedings of Custom Integrated Circuits Conference,
San Jose, 16-19 September 2007, pp. 293-296.
doi:10.1109/CICC.2007.4405736
[35] J.-S. Youn, H.-S. Kang, M.-J. Lee, K.-Y. Park and W.-Y.
Choi, “High-Speed CMOS Integrated Optical Receiver
with an Avalanche Photodetector,” IEEE Photonics Tech-
nology Letters, Vol. 21, No. 20, 2009, pp. 1553-1555.
doi:10.1109/LPT.2009.2029869
[36] A. Sultana, E. Kamrani and M. Sawan, “CMOS Silicon
Avalanche Photodiodes for NIR Light Detection: A Sur-
vey,” Journal of Analog Integrated Circuits and Signal
Processing, 2012, pp. 1-13.
doi:10.1007/s10470-011-9641-6
[37] J.-S. Youn, M.-J. Lee, K.-Y. Park, H. Rücker and W.-Y.
Choi, “7-Gb/s Monolithic Photoreceiver Fabricated with
0.25-μm SiGe BiCMOS Technology,” IEICE Electronics
Express, Vol. 7, No. 9, 2010, pp. 659-665.
doi:10.1587/elex.7.659
[38] E. Kamrani, S. H. A. Yun, F. Lesage and M. Sawan,
“State-of-the-Art Logarithmic Transimpedance Amplifier
with Automatic Gain Control and Ambient Light Rejec-
tion for fNIRS,” Proceedings of SPIE MIOMD-XI, Chi-
cago, 4-8 September 2012, pp. 58-59.
[39] E. Kamrani, S. H. Andy Yun, F. Lesage and M. Sawan,
“Optimal-Adaptive Control System for Low-Noise, Low-
Power and Fast Photodetection in Functional Near Infra-
Red Spectroscopy,” Proceedings of SPIE, MIOMD-XI,
Chicago, 4-8 September 2012.
Copyright © 2012 SciRes. OPJ