M. Saydé et al. / Journal of Biosciences and Medicines 1 (2013) 1-5
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(a) (b)
Figure 5. Spatiotemporal derivative of Figure s 3(a) and (b)
give (a), then (b); and (c) give (b).
(a) (b) (c)
Figure 6. Isotherm map produced from images of Figure 3.
Then applying a median filter to produce homogenous
nn regions
(9)
Figure 6, show same images, thresholded with 16
gray-level, 7 × 7 bo x median filter is applied to generate
homogenous regions, then a Laplacien is used (which is
an isotropic second order derivative operator) to generate
a temperature isotherm map for each picture (from Fig-
ure 3). The variation of temperature from 30˚C to 60˚C
has been quantified into 16 levels (or isotherms). So each
level up represents a 1.875˚C temperature increase.
4. CONCLUSIONS
This paper has introduced a methodology to evaluate and
predict possible thermal stress in large VLSI circuits us-
ing an infrared camera. Important factors contributing to
LAIC circuit thermal heating were presented. The pro-
posed monitoring approach can be applied to produce a
thermal map of the surface of the WaferIC. Then a spatial
and spatiotemporal approach has been presented to ex-
tract from successive thermal images a relevant data
which will help to prevent thermomechanical stress from
damagi ng the WaferIC .
Results reported in this paper are encouraging and
provide a good insight into the issues that will be useful
to the process of defining an automated and embedded
method for detection and management of thermome-
chanical stress in LAICs circuit.
5. ACKNOWL EDG EMENTS
The authors thank the Natural Sciences and Engineering Research
Council of Canad a (NSERC), Le Regroupement Stratégiq ue en Micro-
systèmes du Québec (ReSMIQ) and CMC Microsystems for prov iding
design tools, support and associated technologies. The authors thank
the MITACS and Gestion TechnoCap Inc. for their financial support.
Finally, the authors thank prof. Mohand Said Allili for help with pro-
viding thermal camera.
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